Research · Bavaria, Germany
Electron microscopy suite in a research institute
1.8 µT → 45 nT
01 · Challenge
Image drift on a new TEM caused by a tram line 60 m away and by building service currents.
02 · Simulation
Source separation via synchronised long-term measurement plus a simulation of the room enclosure and residual DC transients.
03 · Solution
A mu-metal room enclosure with active compensation coils for the tram's variable DC component.
04 · Execution
Installed during a scheduled instrument shutdown, followed by joint acceptance testing with the manufacturer.
05 · Result
Residual field below 45 nT peak-to-peak — inside the vendor's specification with margin.
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